Real-time quality monitoring in debutanizer column with regression tree and ANFIS
Year of publication: |
2019
|
---|---|
Authors: | Siddharth, Kumar ; Pathak, Amey ; Pani, Ajaya Kumar |
Published in: |
Journal of Industrial Engineering International. - Heidelberg : Springer, ISSN 2251-712X. - Vol. 15.2019, 1, p. 41-51
|
Publisher: |
Heidelberg : Springer |
Subject: | Debutanizer column | ANFIS | Regression tree | Soft sensor |
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