Regression Analysis of Doubly Censored Failure Time Data Using the Additive Hazards Model
| Year of publication: |
2004
|
|---|---|
| Authors: | Sun, Liuquan ; Kim, Yang-jin ; Sun, Jianguo |
| Published in: |
Biometrics. - The International Biometric Society. - Vol. 60.2004, 3, p. 637-643
|
| Publisher: |
The International Biometric Society |
| Extent: | text/html |
|---|---|
| Type of publication: | Article |
| Source: |
Persistent link: https://www.econbiz.de/10010947329