Regression Analysis of Doubly Censored Failure Time Data with Applications to AIDS Studies
Year of publication: |
1999
|
---|---|
Authors: | Sun, Jianguo ; Liao, Qiming ; Pagano, Marcello |
Published in: |
Biometrics. - The International Biometric Society. - Vol. 55.1999, 3, p. 909-914
|
Publisher: |
The International Biometric Society |
Saved in:
Online Resource
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