Regret Matching with Finite Memory
| Year of publication: |
2010-06-03
|
|---|---|
| Authors: | Saran, Rene ; Serrano, Roberto |
| Institutions: | David K. Levine |
| Extent: | application/pdf |
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| Series: | |
| Type of publication: | Book / Working Paper |
| Language: | English |
| Source: |
Persistent link: https://www.econbiz.de/10008587810