Regularized Estimation for the Accelerated Failure Time Model
Year of publication: |
2009
|
Authors: |
Cai, T.
;
Huang, J.
;
Tian, L.
|
Published in: |
Biometrics. - The International Biometric Society. - Vol. 65.2009, 2, p. 394-404
|
Publisher: |
The International Biometric Society
|
Extent: | text/html |
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Type of publication: | Article
|
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Source: | |
Persistent link: https://ebvufind01.dmz1.zbw.eu/10010947362