Reliability analysis of electronic devices with multiple competing failure modes involving performance aging degradation
Year of publication: |
2003
|
---|---|
Authors: | Huang, Wei ; Askin, Ronald G. |
Published in: |
Quality and reliability engineering international. - Chichester [u.a.] : Wiley, ISSN 0748-8017, ZDB-ID 506412. - Vol. 19.2003, 3, p. 241
|
Saved in:
Saved in favorites
Similar items by person
-
Integrating facility layout with process selection and capacity planning
Askin, Ronald G., (1992)
-
A comparison of scheduling philosophies for manufacturing cells
Askin, Ronald G., (1993)
-
Project selection, scheduling and resource allocation with time dependent returns
Chen, Jiaqiong, (2009)
- More ...