Reliability analysis of electronic devices with multiple competing failure modes involving performance aging degradation
| Year of publication: |
2003
|
|---|---|
| Authors: | Huang, Wei ; Askin, Ronald G. |
| Published in: |
Quality and reliability engineering international. - Chichester [u.a.] : Wiley, ISSN 0748-8017, ZDB-ID 506412. - Vol. 19.2003, 3, p. 241
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