Reliability - Optimal threshold for the k-out-of-n monitor with dual failure modes
| Year of publication: |
2001
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|---|---|
| Authors: | Sibuya, Masaaki ; Suzuki, Kazuyuki |
| Published in: |
Annals of the Institute of Statistical Mathematics : AISM. - Tōkyō [u.a.], Berlin, Heidelberg : Springer, ISSN 0020-3157, ZDB-ID 3903138. - Vol. 53.2001, 2, p. 189-202
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