Reliability prediction of imperfect switching systems subject to Weibull failures
| Year of publication: |
1998
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|---|---|
| Authors: | Pan, J.N. |
| Published in: |
Computers & industrial engineering : CAIE ; an internat. journal. - Amsterdam [u.a.] : Elsevier, ISSN 0360-8352, ZDB-ID 1969936. - Vol. 34.1998, 2, p. 481-492
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