Reliability Test Plans for Exponentiated Log-Logistic Distribution

Abstract A generalization of the log-logistic distribution called exponentiated log-logistic distribution (in lines of exponentiated Weibull distribution suggested by Mudholkar and Srivastava [Technometrics 37: 436-445, 1995]) is considered. In this paper the operating characteristic for a sampling plan is determined for the case that a lot of products is submitted for inspection with lifetimes specified by an exponentiated log-logistic distribution (ELLD). The results are illustrated by a numerical example.