Repaiarable Systems Modeling - New Cumulative Damage Models for Failure Using Stochastic Processes as Initial Damage
| Year of publication: |
2005
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|---|---|
| Authors: | Park, C. ; Padgett, W.J. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 54.2005, 3, p. 530-540
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