Residual-life distributions from component degradation signals: A Bayesian approach
| Year of publication: |
2005
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|---|---|
| Authors: | Gebraeel, Nagi ; Lawley, Mark ; Li, Rong ; Ryan, Jennifer |
| Published in: |
IIE transactions / Institute of Industrial Engineers, Norcross, Ga : industrial engineering and development. - Philadelphia, Pa : Taylor & Francis, ISSN 0569-5554, ZDB-ID 2460191. - Vol. 37.2005, 6, p. 543-558
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