Root cause estimation of faults in production processes : a novel approach inspired by approximate Bayesian computation

Yosuke Otsubo, Naoya Otani, Megumi Chikasue, Mineyuki Nishino and Masashi Sugiyama

Year of publication:	2023
Authors:	Otsubo, Yosuke ; Otani, Naoya ; Chikasue, Megumi ; Nishino, Mineyuki ; Sugiyama, Masashi
Subject:	approximate Bayesian computation \| assembly processes \| density ratio estimation \| machine learning \| process model \| Root cause estimation \| Schätztheorie \| Estimation theory \| Bayes-Statistik \| Bayesian inference \| Künstliche Intelligenz \| Artificial intelligence \| Schätzung \| Estimation

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