SEMICONDUCTOR -- TECHNOLOGY AND RELIABILITY - Interaction of Interface-Traps Located at Various Sites in MOSFETs Under Stress
| Year of publication: |
2002
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|---|---|
| Authors: | Chen, G. ; Li, M.F. ; Jin, Y. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 51.2002, 4, p. 387-391
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