Shelf life prediction by intelligent RFID : technical limits of model accuracy
Reiner Jedermann; Jean-Pierre Emond; Walter Lang
| Year of publication: |
2008
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|---|---|
| Authors: | Jedermann, Reiner ; Emond, Jean-Pierre ; Lang, Walter |
| Published in: |
Dynamics in Logistics : First International Conference, LDIC 2007 Bremen, Germany, August 2007, Proceedings. - Berlin, Heidelberg : Springer, ISBN 978-3-540-76861-6. - 2008, p. 231-238
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| Subject: | RFID | Prognoseverfahren | Forecasting model | Theorie | Theory |