SPECIAL SECTION ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS - Built-In Redundancy Analysis for Memory Yield Improvement
| Year of publication: |
2003
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| Authors: | Huang, C.-T. ; Wu, C.-F. ; Li, J.-F. ; Wu, C.-W. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 52.2003, 4, p. 386-399
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