SPECIAL SECTION PAPERS - Statistical Models for Hot Electron Degradation in Nano-Scaled MOSFET Devices
| Year of publication: |
2007
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| Authors: | Bae, S.J. ; Kim, S.-J. ; Kuo, W. ; Kvam, P.H. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 56.2007, 3, p. 392-400
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