Standardization and Accuracy of Japanese Patent Applicant Names
Year of publication: |
2012
|
---|---|
Authors: | Onishi, Koichiro ; Nishimura, Yoichiro ; Tsukada, Naotoshi ; Yamauchi, Isamu ; Shimbo, Tomoyuki ; Kani, Masayo ; Nakamura, Kenta |
Publisher: |
[S.l.] : SSRN |
Subject: | Japan | Patent | Standardisierung | Standardization | Patentrecht | Patent law |
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