Statistical Modelling of MOS Transistor Mismatch for High-voltage CMOS Processes
Year of publication: |
2005
|
---|---|
Authors: | Posch, Werner ; Enichlmair, Hubert ; Schirgi, Eduard ; Rappitsch, Gerhard |
Published in: |
Quality and reliability engineering international. - Chichester [u.a.] : Wiley, ISSN 0748-8017, ZDB-ID 506412. - Vol. 21.2005, 5, p. 477-490
|
Saved in:
Saved in favorites
Similar items by person
-
Simulation Models for Robust Design Using Location Depth Methods
Stadlober, Ernst, (2003)
- More ...