Survey of reliability studies of consecutive-k-out-of-n:F & related systems
| Year of publication: |
1995
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|---|---|
| Authors: | Chao, M. ; Fu, J. ; Koutras, M. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 44.1995, 1, p. 120-126
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