Synthetic data generation using finite element method to pre-train an image segmentation model for defect detection using infrared thermography
Year of publication: |
2024
|
---|---|
Authors: | Pareek, Kaushal Arun ; May, Daniel ; Meszmer, Peter ; Ras, Mohamad Abo ; Wunderle, Bernhard |
Published in: |
Journal of Intelligent Manufacturing. - New York : Springer US, ISSN 1572-8145. - Vol. 36.2024, 3, p. 1879-1905
|
Publisher: |
New York : Springer US |
Subject: | Flaw detection | Deep learning | Data augmentation | Pre-training | Zero defect manufacturing | Inline inspection | Synthetic data | Finite element method | Image segmentation | Infrared thermography | Non-destructive testing |
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