Systems Reliability - Stochastic Fault Tree Analysis With Self-Loop Basic Events
Year of publication: |
2005
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Authors: | Jenab, K. ; Dhillon, B.S. |
Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 54.2005, 1, p. 173-180
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