Taking the Easy Way Out : How the Ged Testing Program Induces Students to Drop Out
Year of publication: |
[2008]
|
---|---|
Authors: | Heckman, James J. |
Other Persons: | LaFontaine, Paul (contributor) ; Rodriguez, Pedro L. (contributor) |
Publisher: |
[2008]: [S.l.] : SSRN |
Subject: | Abbrecher | Drop-outs | Bildungspolitik | Education policy | Hochschule | Higher education institution | Bildungsreform | Education reform | Schule | School |
Extent: | 1 Online-Ressource (37 p) |
---|---|
Series: | NBER Working Paper ; No. w14044 |
Type of publication: | Book / Working Paper |
Language: | English |
Notes: | Nach Informationen von SSRN wurde die ursprüngliche Fassung des Dokuments May 2008 erstellt |
Source: | ECONIS - Online Catalogue of the ZBW |
-
Taking the Easy Way Out : How the GED Testing Program Induces Students to Drop Out
Heckman, James J., (2021)
-
Taking the easy way out : how the GED testing program induces students to drop out
Heckman, James J., (2012)
-
Taking the easy way out : how the GED testing program induces students to drop out
Heckman, James J., (2008)
- More ...
-
Taking the Easy Way Out : How the GED Testing Program Induces Students to Drop Out
Heckman, James J., (2021)
-
Taking the easy way out : how the GED testing program induces students to drop out
Heckman, James J., (2008)
-
The American High School Graduation Rate : Trends and Levels
Heckman, James J., (2021)
- More ...