Technology scoring model considering rejected applicants and effect of reject inference
| Year of publication: |
2007
|
|---|---|
| Authors: | Kim, Y. ; Sohn, S.Y. |
| Published in: |
Journal of the Operational Research Society : OR. - Basingstoke, Hampshire : Palgrave, ISSN 0030-3623, ZDB-ID 7160331. - Vol. 58.2007, 10, p. 1341-1347
|