Technology Shocks and Aggregate Fluctuations : How Well Does the Real Business Cycle Model Fit Postwar U.S. Data? ; Comments
| Year of publication: |
2005
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|---|---|
| Authors: | McGrattan, Ellen R. ; Ramey, Valerie |
| Published in: |
NBER macroeconomics annual. - Chicago, Ill : Univ. of Chicago Press, ISSN 0889-3365, ZDB-ID 7999884. - Vol. 19.2004, p. 289-314
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