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Testing over-representation of observations in subsets of a DEA technology
Asmild, Mette, (2013)
Is innovation in ICT valuable for the efficiency of Italian museums?
Guccio, Calogero, (2020)
Tracking technology trajectory through regression modelling : a retrospective techno-analysis
Srivastava, Shagun, (2015)
Test for randomness of the technology parameter in a stochastic frontier regression model
Ramanathan, T., (2010)
Nonparametric Capability Indices
Ramanathan, T. V., (2003)
Parametric and non-parametric estimation of value-at-risk
Jadhav, Deepak, (2009)