Testing - Application of a Failure Driven Test Profile in Random Testing
| Year of publication: |
2009
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|---|---|
| Authors: | Chen, T.Y. ; Kuo, F.-C. ; Liu, H. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 58.2009, 1, p. 179-192
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