Testing - Classifying Weak, and Strong Components Using ROC Analysis With Application to Burn-In
| Year of publication: |
2007
|
|---|---|
| Authors: | Wu, S. ; Xie, M. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 56.2007, 3, p. 552-561
|