Testing - Comparison of the Mean Time Between Failures for Two Systems Under Short Tests
Year of publication: |
2009
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Authors: | Scarf, P A ; Cavalcante, C A V ; Dwight, R A ; Gordon, P |
Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 58.2009, 4, p. 589-597
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