TestLAN approach and protocols for the integration of distributed assembly and test networks
| Year of publication: |
2002
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|---|---|
| Authors: | Williams, N.P. ; Liu, Y. ; Nof, S.Y. |
| Published in: |
International journal of production research : American Institute of Industrial Engineers ; Society of Manufacturing Engineers. - London : Taylor & Francis, ISSN 0020-7543, ZDB-ID 1604776. - Vol. 40.2002, 17, p. 4505-4522
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