The Default Risk of Firms Examined with Smooth Support Vector Machines
Year of publication: |
2017
|
---|---|
Authors: | Härdle, Wolfgang |
Other Persons: | Lee, Yuh-Jye (contributor) ; Schäfer, Dorothea (contributor) ; Yeh, Yi-Ren (contributor) |
Publisher: |
[2017]: [S.l.] : SSRN |
Subject: | Mustererkennung | Pattern recognition | Theorie | Theory | Kreditwürdigkeit | Credit rating | Prognoseverfahren | Forecasting model | Kreditrisiko | Credit risk |
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