The effects of ionizing radiation on the functional and parametric performance of NMOS static RAMs
| Year of publication: |
1997
|
|---|---|
| Authors: | Meniconi, M. ; Barry, D.M. ; Betts, D.C. |
| Published in: |
International journal of quality & reliability management. - Bradford : Emerald, ISSN 0265-671X, ZDB-ID 517872. - Vol. 14.1997, 2-3, p. 138-145
|