The Geography of R&D; Tobit Analysis and Bayesian Approach to Mapping R&D Activities for The Netherlands
Year of publication: |
2000
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Authors: | Ouwersloot, Hans ; Rietveld, Piet |
Publisher: |
Amsterdam and Rotterdam : Tinbergen Institute |
Subject: | Industrieforschung | Räumliche Verteilung | Niederlande | R&D | innovation | space | Bayesian approach |
Series: | Tinbergen Institute Discussion Paper ; 00-043/3 |
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Type of publication: | Book / Working Paper |
Type of publication (narrower categories): | Working Paper |
Language: | English |
Other identifiers: | 832788171 [GVK] hdl:10419/85413 [Handle] RePEc:dgr:uvatin:20000043 [RePEc] |
Source: |
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Ouwersloot, Hans, (2000)
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Ouwersloot, Hans, (2000)
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Ouwersloot, Hans, (2000)
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Errors in probability updating behaviour : Measurement and impact analysis
Ouwersloot, Hans, (1998)
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Ouwersloot, Hans, (1997)
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Ouwersloot, Hans, (2001)
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