The Geography of R&D; Tobit Analysis and Bayesian Approach to Mapping R&D Activities for The Netherlands
Year of publication: |
2000-06-06
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Authors: | Ouwersloot, Hans ; Rietveld, Piet |
Institutions: | Tinbergen Instituut |
Subject: | R&D | innovation | space | Bayesian approach |
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Ouwersloot, Hans, (2000)
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Ouwersloot, Hans, (2000)
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Ouwersloot, Hans, (1997)
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Errors in probability updating behaviour : Measurement and impact analysis
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