The R&D value-chain efficiency measurement for high-tech industry in China
Yung-ho Chiu; Chin-wei Huang; Yu-Chuan Chen
| Year of publication: |
2012
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|---|---|
| Authors: | Chiu, Yung-ho ; Huang, Chin Wei ; Chen, Yu Chuan |
| Published in: |
Asia Pacific journal of management : APJM ; a publication of the Faculty of Business Administration, National University of Singapore. - Singapore : Springer, ISSN 0217-4561, ZDB-ID 858501-5. - Vol. 29.2012, 4, p. 989-1006
|
| Subject: | Industrieforschung | Industrial research | Patent | Data-Envelopment-Analyse | Data envelopment analysis | Betriebliche Wertschöpfung | Value creation | Hochtechnologie | High technology | China | 2004-2007 |
| Extent: | graph. Darst. |
|---|---|
| Type of publication: | Article |
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://www.econbiz.de/10009687306