The Second International Conference on Quality and Reliability - Levels of satisfaction among Asian and Western travellers
Year of publication: |
2000
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Authors: | Choi, Tat Y. ; Chu, Raymond |
Published in: |
International journal of quality & reliability management. - Bradford : Emerald, ISSN 0265-671X, ZDB-ID 517872. - Vol. 17.2000, 2, p. 116-131
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