Towards a theory of confidence intervals for system reliability

Consider a binary coherent system of nonrepairable components, the lifelength distributions of which lie in the single parameter exponential family of distributions. Given observations of the lifelengths of the constituent components, it is shown how inversion of the likelihood ratio test can be used to calculate strongly consistent approximate confidence intervals for the survivor function of the system lifelength and for the mean time to system failure.

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Year of publication:	1993
Authors:	Baxter, Laurence A.
Published in:	Statistics & Probability Letters. - Elsevier, ISSN 0167-7152. - Vol. 16.1993, 1, p. 29-38
Publisher:	Elsevier
Keywords:	Binary coherent structure function reliability function likelihood ratio test exponential family of distributions sufficient statistic confidence interval chi-square distribution mean time to failure

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Type of publication:	Article
Source:	RePEc - Research Papers in Economics

Persistent link: https://www.econbiz.de/10005224022