Uncertainties, imitative behaviours and foreign R&D location : explaining the over-concentration of foreign R&D in Beijing and Shanghai within China
Year of publication: |
2007
|
---|---|
Authors: | Sun, Yifei ; Wen, Ke |
Published in: |
Asia Pacific business review. - Abingdon : Routledge, Taylor & Francis Group, ISSN 1360-2381, ZDB-ID 1354763-X. - Vol. 13.2007, 3, p. 405-424
|
Subject: | Beijing | Multinationales Unternehmen | Transnational corporation | Industrieforschung | Industrial research | Regionales Cluster | Regional cluster | Shanghai | China |
-
Sun, Yifei, (2010)
-
Yue, Li, (2024)
-
Liu, Meng-chun, (2012)
- More ...
-
Sun, Yifei, (2007)
-
Sun, Yifei, (2010)
-
Spatial distribution of patents in China
Sun, Yifei, (2000)
- More ...