Understanding the trends in blockchain domain through an unsupervised systematic patent analysis
Year of publication: |
2023
|
---|---|
Authors: | Zanella, Gianluca ; Liu, Charles Zhechao ; Choo, Kim-Kwang Raymond |
Published in: |
IEEE transactions on engineering management : EM. - New York, NY : IEEE, ISSN 0018-9391, ZDB-ID 160438-7. - Vol. 70.2023, 6, p. 1991-2005
|
Subject: | Blockchain | Data mining | Databases | distributed ledger technology | Market research | Monitoring | outlier detection | patent analysis | Patents | Security | unsupervised learning | Patent | Datenbank | Database | Data Mining | Marktforschung | Patentrecht | Patent law |
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