Unit Root Tests with Infinite Variance Errors
| Year of publication: |
2001
|
|---|---|
| Authors: | Ahn, S.K. ; Fotopoulos, S.B. ; He, L. |
| Published in: |
Econometric reviews. - Philadelphia, Pa : Taylor & Francis, ISSN 0731-1761, ZDB-ID 7974632. - Vol. 20.2001, 4, p. 461-484
|