Upper & lower bounds of stress-strength interference reliability with random strength-degradation
| Year of publication: |
1997
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|---|---|
| Authors: | Xue, J. ; Yang, K. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 46.1997, 1, p. 142-145
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