Use of Short‐run Statistical Process Control Techniques: A Comparison of JIT and Non‐JIT Manufacturing
The purpose of this paper is to compare implementation of short‐run (i.e., small lot‐size) statistical process control (SPC) techniques in just‐in‐time (JIT) manufacturing environments. Using U.S. and Japanese questionnaires, this research focuses on the use of several manufacturing elements such as setup time, stability of process and quality improvement. Barriers to the implementation of short‐run SPC techniques are also examined. Results show significant difference in the way some short‐run SPC techniques are utilized by JIT and non‐JIT manufacturers.
Year of publication: |
2000
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Authors: | Kim, Gyu C. ; Schniederjans, Marc J. |
Published in: |
American Journal of Business. - MCB UP Ltd, ISSN 1935-5181, ZDB-ID 2401319-5. - Vol. 15.2000, 2, p. 77-84
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Publisher: |
MCB UP Ltd |
Subject: | Short‐run statistical processes | SPC techniques | Just‐in‐time manufacturing | Control techniques |
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