Using Profile Monitoring Techniques for a Data-rich Environment with Huge Sample Size
| Year of publication: |
2005
|
|---|---|
| Authors: | Wang, Kaibo ; Tsung, Fugee |
| Published in: |
Quality and reliability engineering international. - Chichester [u.a.] : Wiley, ISSN 0748-8017, ZDB-ID 506412. - Vol. 21.2005, 7, p. 677-688
|