Validating forecasts of the joint probability density of bond yields : can affine models beat random walk?
Year of publication: |
2006
|
---|---|
Authors: | Egorov, Alexej V. ; Hong, Yongmiao ; Li, Haitao |
Published in: |
Journal of econometrics. - Amsterdam [u.a.] : Elsevier, ISSN 0304-4076, ZDB-ID 184861-6. - Vol. 135.2006, 1/2, p. 255-284
|
Subject: | Prognoseverfahren | Forecasting model | Zinsstruktur | Yield curve | Risikomanagement | Risk management | Portfolio-Management | Portfolio selection | Risikomaß | Risk measure |
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