Value analysis tear down : a new process for product development and innovation
Yoshihiko Sato and J. Jerry Kaufman
| Year of publication: |
2005 ; 1. ed.
|
|---|---|
| Authors: | Satō, Yoshihiko ; Kaufman, J. Jerry |
| Publisher: |
New York, NY : Industrial Press [u.a.] |
| Extent: | X, 206 S. : Ill., graph. Darst. |
|---|---|
| Type of publication: | Book / Working Paper |
| Language: | English |
| ISBN: | 0-8311-3203-5 |
| Source: |
Persistent link: https://www.econbiz.de/10004814524