Value-at-Risk and Expected Shortfall when there is long range dependence.
Year of publication: |
2008-01
|
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Authors: | Härdle, Wolfgang ; Mungo, Julius |
Institutions: | Sonderforschungsbereich 649: Ökonomisches Risiko, Wirtschaftswissenschaftliche Fakultät |
Subject: | Backtesting | Value-at-Risk | Expected Shortfall | Long Memory | Fractional Integrated Volatility Models |
Extent: | application/pdf |
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Series: | |
Type of publication: | Book / Working Paper |
Language: | English |
Notes: | Number SFB649DP2008-006 40 pages |
Classification: | C14 - Semiparametric and Nonparametric Methods ; C32 - Time-Series Models ; C52 - Model Evaluation and Testing ; C53 - Forecasting and Other Model Applications ; G12 - Asset Pricing |
Source: |
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