Wafer bin map recognition using a neural network approach
| Year of publication: |
2002
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|---|---|
| Authors: | Liu, S.F. ; Chen, F.L. ; Lu, W.B. |
| Published in: |
International journal of production research : American Institute of Industrial Engineers ; Society of Manufacturing Engineers. - London : Taylor & Francis, ISSN 0020-7543, ZDB-ID 1604776. - Vol. 40.2002, 10, p. 2207-2224
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