Wavelet-based neural network and statistical approaches applied to automated visual inspection of LED chips
| Year of publication: |
2008
|
|---|---|
| Authors: | Lin, Hong-Dar ; Lin, Gary C. ; Chung, Chung-Yu ; Lin, Wan-Ting |
| Published in: |
Journal of scientific and industrial research : JSIR. - New Delhi : Council, ISSN 0022-4456, ZDB-ID 4104080. - Vol. 67.2008, 6, p. 412-420
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