What determines the duration of patent examination in China? : an outcome-specific duration analysis of invention patent applications at SIPO
Tony W. Tong, Kun Zhang, Zi-Lin He, Yuchen Zhang
| Year of publication: |
April 2018
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| Authors: | Tong, Tony W. ; Zhang, Kun ; He, Zi-Lin ; Zhang, Yuchen |
| Published in: |
Research policy : policy, management and economic studies of science, technology and innovation. - Amsterdam [u.a.] : Elsevier, ISSN 0048-7333, ZDB-ID 121149-3. - Vol. 47.2018, 3, p. 583-591
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| Subject: | Patent | Examination duration | Grant | Withdrawal | Refusal | Intellectual property right (IPR) | Survival analysis | Competing risks | State intellectual property office (SIPO) | China | Immaterialgüterrechte | Intellectual property rights | Patentrecht | Patent law | Dauer | Duration | Erfindung | Invention | Statistische Bestandsanalyse | Duration analysis |
| Type of publication: | Article |
|---|---|
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Other identifiers: | 10.1016/j.respol.2018.01.002 [DOI] |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://ebvufind01.dmz1.zbw.eu/10011972323