X-ray photoelectron diffraction study of ultrathin PbTiO<Subscript>3</Subscript> films

Full hemispherical X-ray photoelectron diffraction (XPD) experiments have been performed to investigate at the atomic level ultrathin epitaxial c-axis oriented PbTiO<Subscript>3</Subscript> (PTO) films grown on Nb-doped SrTiO<Subscript>3</Subscript> substrates. Comparison between experiment and theory allows us to identify a preferential ferroelectric polarization state in a 60 Å -thick PTO film. Multiple scattering theory based on a cluster-model [ Phys. Rev. B <InlineEquation ID="Equ1"> <EquationSource Format="TEX">$\textbf{63}$</EquationSource> </InlineEquation>, 075404 (2001)] is used to simulate the experiments. Copyright EDP Sciences/Società Italiana di Fisica/Springer-Verlag 2006